Two methods of integrated circuit testing in the field of electromagnetic compatibility

1.Introduction

As the most promising technology, integrated circuit related technology has become the most promising high-tech technology in the world. Currently, the country attaches great importance to the field of integrated circuit chip research and development, especially in the field of integrated circuit chip research and development.

In recent years, more and more research institutions, universities, and research and development departments of IC enterprises in China have gradually paid attention to and engaged in research on electromagnetic compatibility (IC EMC) of integrated circuits. Currently, research on IC EMC abroad has started early and developed rapidly, forming a relatively complete theoretical system and advanced testing and research equipment in Europe, France, Germany, the United States, South Korea, Japan, Singapore, and other countries. At present, research on relevant IC EMC in China is concentrated in National University of Defense Technology, Zhejiang University, PLA Information Engineering University, Institute of Microelectronics, Chinese Academy of Sciences and other universities, and has made important achievements in recent years.

2. Electromagnetic sensitivity

Electromagnetic compatibility is divided into electromagnetic interference (EMI) and electromagnetic sensitivity (EMS). In short, EMI refers to electromagnetic radiation that affects the normal operation of other devices, and EMS refers to the ability of the device to resist external electromagnetic radiation interference. Currently, electromagnetic sensitivity testing is divided into multiple projects such as conduction, radiation, electrostatic discharge, fast pulse bursts, and surges. This article introduces two testing methods.

3. Electromagnetic sensitivity test method

3.1 Conducted Immunity

Conducted immunity tests are mainly divided into direct power injection method and high current injection method. The direct power injection method is introduced here. The direct power injection method generates interference pulses through interference sources, injects them into the network through power amplifiers and directional couplers, and then injects them into the test equipment. The functional state of the device determines the magnitude of the injection voltage through fault diagnosis. The test block diagram is shown in Figure 1, and Figure 2 shows the configuration of the actual device. Refer to IEC62132 for specific configuration.

Figure 1. Test Block Diagram

Figure 2. Test Equipment

During the testing process, attention should be paid to testing in accordance with the testing standards as much as possible. In addition, the design of relevant test boards should fully consider the grounding settings.

3.2 Electrostatic discharge

Electrostatic discharge test is an important project in equipment immunity test. At present, electrostatic discharge testing is an important project in equipment immunity testing. ESD research in China started early and has achieved good research results. ESD related testing equipment is too expensive for general small research institutions to engage in further research, and their research results are mainly concentrated in large research institutions with complete testing equipment.

Currently, the general international standard for ESD testing, IEC61000, specifies the amplitude and rise time of ESD pulses, as shown in Figure 3. Figure 4 shows a standard ESD generator model.

图3.ESD脉冲波形

Figure 4. ESD Generator Model

The ESD test method is simple, just press the test probe onto the test pin and inject a pulse waveform. During the testing process, the tester should wear a grounding bracelet throughout the entire process to prevent electrostatic interference from the human body.